SEM

Scanning Electron Microscopy (SEM) analysis is an analytical technique used for analyzing a wide range of materials at high magnifications in order to produce images in high-resolution. It stands for a test process where scanning a sample with an electron beam can lead to producing magnified images for further analysis. At TH Re-MINING, we effectively apply SEM analysis in microanalysis and the so-called failure analysis of solid inorganic materials. The technique itself is performed at high magnifications, which allow us to generate images in high resolution and to precisely measure even the smallest features as well as objects. By performing SEM analysis, TH Re-MINING, therefore, offers high-quality analysis and imaging services. We provide you with small-scale rapid-response characterization as well as a combination used in compliance testing and failure analysis.

Scanning Electron Microscope (SEM) used for scanning samples and producing images.